<
From version < 2.3 >
edited by Uwe Trueggelmann
on 2024/11/21 14:23
To version < 2.10 >
edited by Uwe Trueggelmann
on 2024/11/21 15:03
>
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41 41  
42 42  === Quality Management System Requirements ===
43 43  
44 -* Lack of qualification data, and major NC without CSI letter prohibit CQM certification (#0654#)
45 -* IQC (Incoming Quality Control) to be assessed for each product, and not just once as part of the QMS
46 -* Separation of #0703# Release of Product and Services, Batch Yield Limit, into two independent requirements #0703# and #0707#, Batch Yield Limit now only applicable to products containing an IC.
47 -* Requirement to implement SPC and CpK restricted to ic icm iacicm bsm il iacil iac, so where processes involve wafer processing or IC packaging processes.
44 +* //#0654#: Design and Development – Product Qualification Report// — Lack of qualification data, and major NC without CSI letter now prohibit CQM certification
45 +* IQC (Incoming Quality Control) to be assessed during CQM Audits for each CQM product and component, and not just once as part of the QMS
46 +* //#0703# Release of Product and Services, Batch Yield Limit// — split into two independent requirements: //#0703#: Production and Service Provision – Release of Product and Services// and //#0707#: Production and Service Provision – Batch Yield Limit//; Batch Yield Limit now only applicable to products containing an IC.
47 +* Requirements to implement SPC (//#0705#: Performance evaluation – Statistical Process Control//) and CpK (//#0811#: Performance evaluation – Process Capability//) restricted to ic icm iacicm bsm il iacil iac, that is, where processes involve wafer processing or IC packaging processes.
48 48  
49 49  === Product Requirements ===
50 50  
51 -* For cards, when testing Resistance to Chemicals, clarified that where// #3058#: Solidity – Adhesion of ICM to Card// is required, one sample per solution shall be tested for //#3058#: Solidity – Adhesion of ICM to Card//
52 -* Increased permitted levels of ESD conductivity for //#3050#: ESD Conductivity - ESC//
53 -* Permitting greater tolerances in //#3067#: Suitability for an Identification Notch//
54 -* //#3110#: IAC – Interactive Cards – Requirement to maintain a valid CSI Letter// restricted to specific products, clarified to which products and components this requirement still applies.
55 -* Added //#3120#: Pilot, innovative, and interactive cardholder identification products requirement to undergo CQM Audits depending on annual production volume//, easing CQM audit and CQM certification requirements for innovative and interactive cardholder products with very small volumes.
56 -* Made //#3130#: Products that are not compliant with applicable CQM requirements – Requirement to maintain a valid CSI Letter// individual requirement to clarify that CQM non conformities must be covered by a CSI letter.
51 +* #3046#: Resistance to Chemicals — For CQM products and components where// #3058#: Solidity – Adhesion of ICM to Card// is required, clarified that one sample per solution shall be tested for //#3058#: Solidity – Adhesion of ICM to Card//
52 +* //#3050#: ESD Conductivity – ESC — //Increased permitted levels of ESD conductivity
53 +* //#3067#: Suitability for an Identification Notch//Permitting greater tolerances
54 +* //#3110#: IAC – Interactive Cards – Requirement to maintain a valid CSI Letter// restricted to specific products, clarified to which products and components this requirement still applies.
55 +* //#3120#: Pilot, innovative, and interactive cardholder identification products// – //requirement to undergo CQM Audits depending on annual production volume// — New requirement easing CQM audit and CQM certification requirements for innovative and interactive cardholder products with very small volumes.
56 +* //#3130#: Products that are not compliant with applicable CQM requirements – Requirement to maintain a valid CSI Letter// — Now an individual requirement to clarify better that CQM non conformities must be covered by a CSI letter.
57 57  * //#3057#: 3 wheel Test Robustness for Interactive Cards (“IAC”) and ICC made without an ICM// — added clarification regarding re-using samples and regarding interpretation of test results with higher force than required.
58 58  * //#2041#: Fingerprint Sensor – Resistance to Abrasion// — Reworded to improve understanding.
59 59  * //#3058#: Solidity – Adhesion of ICM to Card// — TBD
... ... @@ -63,4 +63,5 @@
63 63  
64 64  * //#7010#: Pantone-Colours//  — specified measurement parameters for colour measurement using spectrometer
65 65  * //#7120#: Security Devices (Hologram, PBM, magnetic stripe with hologram like surface, Signature Panel) – Adhesion, Aspect and Shape, Size and Positioning// — clarified that if cross-hatch necessary, a new sample shall be used
66 +* //#8093#: Temperature Cycling// — extended maximum period between removal from oven and verification of functionality to 72h to accommodate weekends
66 66  * //#8310#: Resistance of a Fingerprint Sensor against Scratching// — Additional details specified
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