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42	42	=== Quality Management System Requirements ===
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44		-* //#0654#: Design and Development – Product Qualification Report// — Lack of qualification data, and major NC without CSI letter now prohibit CQM certification
45		-* IQC (Incoming Quality Control) to be assessed during CQM Audits for each CQM product and component, and not just once as part of the QMS
46		-* //#0703# Release of Product and Services, Batch Yield Limit// — split into two independent requirements: //#0703#: Production and Service Provision – Release of Product and Services// and //#0707#: Production and Service Provision – Batch Yield Limit//; Batch Yield Limit now only applicable to products containing an IC.
47		-* Requirements to implement SPC (//#0705#: Performance evaluation – Statistical Process Control//) and CpK (//#0811#: Performance evaluation – Process Capability//) restricted to ic icm iacicm bsm il iacil iac, that is, where processes involve wafer processing or IC packaging processes.
	44	+* Lack of qualification data, and major NC without CSI letter prohibit CQM certification (#0654#)
	45	+* IQC (Incoming Quality Control) to be assessed for each product, and not just once as part of the QMS
	46	+* Separation of #0703# Release of Product and Services, Batch Yield Limit, into two independent requirements #0703# and #0707#, Batch Yield Limit now only applicable to products containing an IC.
	47	+* Requirement to implement SPC and CpK restricted to ic icm iacicm bsm il iacil iac, so where processes involve wafer processing or IC packaging processes.
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49	49	=== Product Requirements ===
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51	51	* For cards, when testing Resistance to Chemicals, clarified that where// #3058#: Solidity – Adhesion of ICM to Card// is required, one sample per solution shall be tested for //#3058#: Solidity – Adhesion of ICM to Card//
52		-* Increased permitted levels of ESD conductivity for //#3050#: ESD Conductivity — ESC//
	52	+* Increased permitted levels of ESD conductivity for //#3050#: ESD Conductivity - ESC//
53	53	* Permitting greater tolerances in //#3067#: Suitability for an Identification Notch//
54	54	* //#3110#: IAC – Interactive Cards – Requirement to maintain a valid CSI Letter// restricted to specific products, clarified to which products and components this requirement still applies.
55	55	* Added //#3120#: Pilot, innovative, and interactive cardholder identification products requirement to undergo CQM Audits depending on annual production volume//, easing CQM audit and CQM certification requirements for innovative and interactive cardholder products with very small volumes.
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64	64	* //#7010#: Pantone-Colours//  — specified measurement parameters for colour measurement using spectrometer
65	65	* //#7120#: Security Devices (Hologram, PBM, magnetic stripe with hologram like surface, Signature Panel) – Adhesion, Aspect and Shape, Size and Positioning// — clarified that if cross-hatch necessary, a new sample shall be used
66		-* //#8093#: Temperature Cycling// — extended maximum period between removal from oven and verification of functionality to 72h to accommodate weekends
67	67	* //#8310#: Resistance of a Fingerprint Sensor against Scratching// — Additional details specified